Degradation of the frequency response of photodiodes in measurements of strong optical signals

Authors

  • Gastón Arrigo
  • Patricio Sorichetti
  • Eduardo Omar Acosta Universidad de Buenos Aires

DOI:

https://doi.org/10.37537/rev.elektron.1.2.23.2017

Keywords:

PIN photodiode, Detector bandwidth, Phase Response

Abstract

In this paper we present measurements that reveal changes in the frequency response of a PIN-type photodetector with the increase of the intensity of the light reaching the detector. In particular, two effects are observed at high illumination levels: the bandwidth of the detector decreases and the phase response is modified. For low intensities the bandwidth follows a power law with exponent -1 with the average current of the photodetector, but at high illumination the exponent tends to -0.5.

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References

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Published

2017-11-11

Issue

Section

Optoelectronics and Microelectronics

How to Cite

[1]
G. Arrigo, P. Sorichetti, and E. O. Acosta, “Degradation of the frequency response of photodiodes in measurements of strong optical signals”, Elektron, vol. 1, no. 2, pp. 75–78, Nov. 2017, doi: 10.37537/rev.elektron.1.2.23.2017.