MOS devices for dosimetry applications
DOI:
https://doi.org/10.37537/rev.elektron.10.1.237.2026Keywords:
Radiation effects, MOS devices, MOS dosimetryAbstract
This work presents a review of MOS dosimetry from its physical principles up to the most recent developments. The limitations of MOS dosimeters are analyzed and the usually considered solutions are described. MOS dosimeters based on alternative structures, such as floating gate devices, are also discussed.
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